Vol. 19, Issue 2, 2022June 01, 2022 EDT
Investigation of Thermomechanical Stress Generation in Embedded-Die Substrate Package
Investigation of Thermomechanical Stress Generation in Embedded-Die Substrate Package
Matsuura, Masamitsu, Tanemasa Asano, and Haruichi Kanaya. 2022. “Investigation of Thermomechanical Stress Generation in Embedded-Die Substrate Package.” Journal of Microelectronics and Electronic Packaging 19 (2): 65–70. https://doi.org/10.4071/imaps.1715287.