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ISSN 1551-4897
Technical Article
Vol. 19, Issue 2, 2022June 01, 2022 EDT

Towards Improvement of the Reliability of Advanced Packaging: The Pivotal Role of Uniformity of Electrolytic Deposition Processes

Ralf Schmidt, Jens Palm, Christian Schwarz, Jan M. Knaup,
Advanced packagingcopper bumphybrid bumpcopperelectrodepositionuniformitycoplanarity
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1700218
Journal of Microelectronics & Elect Pkg
Schmidt, Ralf, Jens Palm, Christian Schwarz, and Jan M. Knaup. 2022. “Towards Improvement of the Reliability of Advanced Packaging: The Pivotal Role of Uniformity of Electrolytic Deposition Processes.” Journal of Microelectronics and Electronic Packaging 19 (2): 71–76. https:/​/​doi.org/​10.4071/​imaps.1700218.

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