ISSN 1551-4897
Vol. 19, Issue 3, 2022September 01, 2022 EDT
GE SiC Semiconductor Device Operation at Extreme Temperatures
GE SiC Semiconductor Device Operation at Extreme Temperatures
Esler, David. 2022. “GE SiC Semiconductor Device Operation at Extreme Temperatures.” Journal of Microelectronics and Electronic Packaging 19 (3): 83–88. https://doi.org/10.4071/imaps.1531475.