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Vol. 1, Issue 3, 2004July 01, 2004 EDT

Measurements of Thermal Conductivity of Thin Films by Means of Comparative Method

Selim Achmatowicz, Iwona Wyżkiewicz, Elżbieta Zwierkowska, Wojciech Łobodziński,
Thermal conductivitymeasurementsthin filmthick film technology
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-1.3.176
Journal of Microelectronics & Elect Pkg
Achmatowicz, Selim, Iwona Wyżkiewicz, Elżbieta Zwierkowska, and Wojciech Łobodziński. 2004. “Measurements of Thermal Conductivity of Thin Films by Means of Comparative Method.” Journal of Microelectronics and Electronic Packaging 1 (3): 176–86. https:/​/​doi.org/​10.4071/​1551-4897-1.3.176.
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