Skip to main content
null
Journal of Microelectronics & Elect Pkg
  • Menu
  • Articles
    • General
    • Technical Article
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • IMAPSource Proceedings
  • search

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:47514/feed
General
Vol. 11, Issue 1, 2014January 01, 2014 EDT

Mechanical Stress Analyses of Packaged Pressure Sensors for Very High Temperatures

Roderich Zeiser, Suleman Ayub, Jochen Hempel, Michael Berndt, Juergen Wilde,
Digital image correlation (DIC)high temperaturepackaging stresspressure sensorstrain gauges
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.399
Journal of Microelectronics & Elect Pkg
Zeiser, Roderich, Suleman Ayub, Jochen Hempel, Michael Berndt, and Juergen Wilde. 2014. “Mechanical Stress Analyses of Packaged Pressure Sensors for Very High Temperatures.” Journal of Microelectronics and Electronic Packaging 11 (1): 30–35. https:/​/​doi.org/​10.4071/​imaps.399.
Save article as...▾

View more stats

This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Powered by Scholastica, the modern academic journal management system