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Vol. 11, Issue 1, 2014January 01, 2014 EDT

Mechanical Stress Analyses of Packaged Pressure Sensors for Very High Temperatures

Roderich Zeiser, Suleman Ayub, Jochen Hempel, Michael Berndt, Juergen Wilde,
Digital image correlation (DIC)high temperaturepackaging stresspressure sensorstrain gauges
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.399
Journal of Microelectronics & Elect Pkg
Zeiser, Roderich, Suleman Ayub, Jochen Hempel, Michael Berndt, and Juergen Wilde. 2014. “Mechanical Stress Analyses of Packaged Pressure Sensors for Very High Temperatures.” Journal of Microelectronics and Electronic Packaging 11 (1): 30–35. https:/​/​doi.org/​10.4071/​imaps.399.

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