Effectiveness of Barrier Layer Metallizations in Long Term High Temperature Endurance Tests on Wire Bond Interconnections

Riches, S. T., C. Johnston, and A. Lui. 2013. “Effectiveness of Barrier Layer Metallizations in Long Term High Temperature Endurance Tests on Wire Bond Interconnections.” Journal of Microelectronics and Electronic Packaging 10 (4): 163–70. https:/​/​doi.org/​10.4071/​imaps.392.