Vol. 11, Issue 2, 2014April 01, 2014 EDT
Wide Band Measurement of Dielectric Properties of Electronic Assembly Materials Inside an LTCC Fluidic Structure
Wide Band Measurement of Dielectric Properties of Electronic Assembly Materials Inside an LTCC Fluidic Structure
Müller, Jens. 2014. “Wide Band Measurement of Dielectric Properties of Electronic Assembly Materials Inside an LTCC Fluidic Structure.” Journal of Microelectronics and Electronic Packaging 11 (2): 64–69. https://doi.org/10.4071/imaps.400.