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Vol. 11, Issue 2, 2014April 01, 2014 EDT

Copper Wirebond Compatibility with Organic and Inorganic Ions Present in Mold Compounds

Varughese Mathew, Sheila Chopin, Leo Higgins, Yingrui Zhang,
Copper wirebondcorrosionCu-Al integritymold compoundsreliability
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.410
Journal of Microelectronics & Elect Pkg
Mathew, Varughese, Sheila Chopin, Leo Higgins, and Yingrui Zhang. 2014. “Copper Wirebond Compatibility with Organic and Inorganic Ions Present in Mold Compounds.” Journal of Microelectronics and Electronic Packaging 11 (2): 70–74. https:/​/​doi.org/​10.4071/​imaps.410.
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