Loading [Contrib]/a11y/accessibility-menu.js

This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Skip to main content
null
Journal of Microelectronics & Elect Pkg
  • Menu
  • Articles
    • General
    • Technical Article
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • IMAPSource Proceedings
  • search
  • LinkedIn (opens in a new tab)
  • RSS feed (opens a modal with a link to feed)

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:48324/feed
ISSN 1551-4897
General
Vol. 11, Issue 4, 2014October 01, 2014 EDT

Thermal Cycling Reliability of Alternative Low-Silver Tin-Based Solders

Elviz George, Michael Osterman, Michael Pecht, Richard Coyle, Richard Parker, Elizabeth Benedetto,
Alternative soldersiNEMI characterization of Pb-free alloy alternatives projectlow silver lead-free solderthermal cycling reliability
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.424
Journal of Microelectronics & Elect Pkg
George, Elviz, Michael Osterman, Michael Pecht, Richard Coyle, Richard Parker, and Elizabeth Benedetto. 2014. “Thermal Cycling Reliability of Alternative Low-Silver Tin-Based Solders.” Journal of Microelectronics and Electronic Packaging 11 (4): 137–45. https:/​/​doi.org/​10.4071/​imaps.424.

View more stats

Powered by Scholastica, the modern academic journal management system