Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth

Joseph M. Juarez; Polina Snugovsky; Eva Kosiba; Zohreh Bagheri; Subramaniam Suthakaran; Michael Robinson; Joel Heebink; Jeffrey Kennedy; Marianne Romansky

doi:10.4071/imaps.441

Juarez, Joseph M., Polina Snugovsky, Eva Kosiba, Zohreh Bagheri, Subramaniam Suthakaran, Michael Robinson, Joel Heebink, Jeffrey Kennedy, and Marianne Romansky. 2015. “Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth.” Journal of Microelectronics and Electronic Packaging 12 (1): 1–28. https://doi.org/10.4071/imaps.441.

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