Vol. 12, Issue 1, 2015January 01, 2015 EDT
Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth
Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth
Juarez, Joseph M., Polina Snugovsky, Eva Kosiba, Zohreh Bagheri, Subramaniam Suthakaran, Michael Robinson, Joel Heebink, Jeffrey Kennedy, and Marianne Romansky. 2015. “Manufacturability and Reliability Screening of Lower Melting Point, Pb-Free Alloys Containing Bismuth.” Journal of Microelectronics and Electronic Packaging 12 (1): 1–28. https://doi.org/10.4071/imaps.441.