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Vol. 12, Issue 2, 2015April 01, 2015 EDT

Effect of Process Parameters on Free Air Ball Integrity in Copper and Palladium-Coated Copper Bonding Wires

Noritoshi Araki, Yasutomo Ichiyama, Ryo Oishi, Teruo Haibara, Takashi Yamada,
Copper wireEFO parametersfree air ballpalladium-coated copper wirewire bonding
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.460
Journal of Microelectronics & Elect Pkg
Araki, Noritoshi, Yasutomo Ichiyama, Ryo Oishi, Teruo Haibara, and Takashi Yamada. 2015. “Effect of Process Parameters on Free Air Ball Integrity in Copper and Palladium-Coated Copper Bonding Wires.” Journal of Microelectronics and Electronic Packaging 12 (2): 98–103. https:/​/​doi.org/​10.4071/​imaps.460.

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