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Vol. 12, Issue 3, 2015July 01, 2015 EDT

High Shear Speed Characteristics of Sub-100 μm Low Alpha SAC105 Solder Bump Directly Fabricated on Cu Filled Through Si Via for 3D Integration

Do Hyun Jung, Shalu Agarwal, Santosh Kumar, Jae Pil Jung,
Through Si vialow alpha soldersoft errorelectroplatinghigh-speed shear test
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.416
Journal of Microelectronics & Elect Pkg
Jung, Do Hyun, Shalu Agarwal, Santosh Kumar, and Jae Pil Jung. 2015. “High Shear Speed Characteristics of Sub-100 Μm Low Alpha SAC105 Solder Bump Directly Fabricated on Cu Filled Through Si Via for 3D Integration.” Journal of Microelectronics and Electronic Packaging 12 (3): 161–69. https:/​/​doi.org/​10.4071/​imaps.416.
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