Vol. 13, Issue 3, 2016July 01, 2016 EDT
Round-Robin of High-Frequency Test Methods by IPC-D24C Task Group
Round-Robin of High-Frequency Test Methods by IPC-D24C Task Group
Oliver, Glenn, Jonathan Weldon, Chudy Nwachukwu, John Andresakis, John Coonrod, David L. Wynants, and Don DeGroot. 2016. “Round-Robin of High-Frequency Test Methods by IPC-D24C Task Group.” Journal of Microelectronics and Electronic Packaging 13 (3): 77–94. https://doi.org/10.4071/imaps.508.