Thick Film Process Characterization for Thin Film Metallized LTCC

M. A. Girardi; K. A. Peterson; P. T. Vianco

doi:10.4071/imaps.512

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Girardi, M. A., K. A. Peterson, and P. T. Vianco. 2016. “Thick Film Process Characterization for Thin Film Metallized LTCC.” Journal of Microelectronics and Electronic Packaging 13 (3): 136–42. https://doi.org/10.4071/imaps.512.

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