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Vol. 14, Issue 1, 2017January 01, 2017 EDT

Temporary Wafer Bonding Materials with Mechanical and Laser Debonding Technologies for Semiconductor Device Processing

Xiao Liu, Qi Wu, Dongshun Bai, Trevor Stanley, Alvin Lee, Jay Su, Baron Huang,
Temporary wafer bondingmechanical debondlaser debondhigh-temperature survivability
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.349121
Journal of Microelectronics & Elect Pkg
Liu, Xiao, Qi Wu, Dongshun Bai, Trevor Stanley, Alvin Lee, Jay Su, and Baron Huang. 2017. “Temporary Wafer Bonding Materials with Mechanical and Laser Debonding Technologies for Semiconductor Device Processing.” Journal of Microelectronics and Electronic Packaging 14 (1): 39–43. https:/​/​doi.org/​10.4071/​imaps.349121.
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