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Vol. 14, Issue 1, 2017January 01, 2017 EDT

Proposal of Ultrafine and High Reliable Trench Wiring Process for Organic Interposer

Kazuyuki Mitsukura, Masaya Toba, Kousuke Urashima, Yoshinori Ejiri, Kenichi Iwashita, Tomonori Minegishi, Kazuhiko Kurafuchi,
Organic interposertrench wiringphotosensitive dielectricbiased HASTinsulation reliabilitycopper pastesintered copper
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.348184
Journal of Microelectronics & Elect Pkg
Mitsukura, Kazuyuki, Masaya Toba, Kousuke Urashima, Yoshinori Ejiri, Kenichi Iwashita, Tomonori Minegishi, and Kazuhiko Kurafuchi. 2017. “Proposal of Ultrafine and High Reliable Trench Wiring Process for Organic Interposer.” Journal of Microelectronics and Electronic Packaging 14 (1): 26–31. https:/​/​doi.org/​10.4071/​imaps.348184.
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