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Vol. 14, Issue 2, 2017April 01, 2017 EDT

Reliable Young’s Modulus Value of High Flexible, Treated Rolled Copper Foils Measured by Resonance Method

Kazuki Kammuri, Atsushi Miki, Hiroki Takeuchi,
Copper foilYoung's modulusresonance methodtensile methodcrystallographic orientationfatigue
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.454688
Journal of Microelectronics & Elect Pkg
Kammuri, Kazuki, Atsushi Miki, and Hiroki Takeuchi. 2017. “Reliable Young’s Modulus Value of High Flexible, Treated Rolled Copper Foils Measured by Resonance Method.” Journal of Microelectronics and Electronic Packaging 14 (2): 70–76. https:/​/​doi.org/​10.4071/​imaps.454688.
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