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Vol. 9, Issue 3, 2012July 01, 2012 EDT

Automated Complex Permittivity Characterization of Ceramic Substrates Considering Surface-Roughness Loss

A. Ege Engin, Pavithra Pasunoori,
Dielectric constantHTCCloss tangentmaterials characterizationtracking sensitivitysurface roughness
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.339
Journal of Microelectronics & Elect Pkg
Engin, A. Ege, and Pavithra Pasunoori. 2012. “Automated Complex Permittivity Characterization of Ceramic Substrates Considering Surface-Roughness Loss.” Journal of Microelectronics and Electronic Packaging 9 (3): 144–48. https:/​/​doi.org/​10.4071/​imaps.339.
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