Skip to main content
null
Journal of Microelectronics & Elect Pkg
  • Menu
  • Articles
    • General
    • Technical Article
    • All
  • For Authors
  • Editorial Board
  • About
  • Issues
  • IMAPSource Proceedings
  • search

RSS Feed

Enter the URL below into your favorite RSS reader.

http://localhost:4529/feed
General
Vol. 8, Issue 1, 2011January 01, 2011 EDT

The Effects of Temperature Profile of Accelerated Temperature Cycling Tests on the Reliability of ACA Joints in RFID Tags

Kirsi Saarinen, Laura Frisk,
Anisotropic conductive adhesiveReliabilitytemperature tests
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.279
Journal of Microelectronics & Elect Pkg
Saarinen, Kirsi, and Laura Frisk. 2011. “The Effects of Temperature Profile of Accelerated Temperature Cycling Tests on the Reliability of ACA Joints in RFID Tags.” Journal of Microelectronics and Electronic Packaging 8 (1): 10–15. https:/​/​doi.org/​10.4071/​imaps.279.
Save article as...▾

View more stats

This website uses cookies

We use cookies to enhance your experience and support COUNTER Metrics for transparent reporting of readership statistics. Cookie data is not sold to third parties or used for marketing purposes.

Powered by Scholastica, the modern academic journal management system