X-Ray Inspection of LTCC Devices: Theory and Practice

Krzysztof Zaraska; Janina Gaudyn; Adam Bienńkowski; Marek Dohnalik; Andrzej Czerwiński; Mariusz Płuska; Monika Machnik; Katarzyna Wójcik

doi:10.4071/imaps.289

Zaraska, Krzysztof, Janina Gaudyn, Adam Bienńkowski, Marek Dohnalik, Andrzej Czerwiński, Mariusz Płuska, Monika Machnik, and Katarzyna Wójcik. 2011. “X-Ray Inspection of LTCC Devices: Theory and Practice.” Journal of Microelectronics and Electronic Packaging 8 (2): 49–57. https://doi.org/10.4071/imaps.289.

View more stats

X-Ray Inspection of LTCC Devices: Theory and Practice

This website uses cookies