Vol. 8, Issue 4, 2011October 01, 2011 EDT
System-on-Chip Integrated MEMS Packages for RF LNA Testing and Self-Calibration
System-on-Chip Integrated MEMS Packages for RF LNA Testing and Self-Calibration
Kim, Bruce C., Sukeshwar Kannan, Sai Shravan Evana, and Seok-Ho Noh. 2011. “System-on-Chip Integrated MEMS Packages for RF LNA Testing and Self-Calibration.” Journal of Microelectronics and Electronic Packaging 8 (4): 154–63. https://doi.org/10.4071/imaps.302.