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Vol. 9, Issue 1, 2012January 01, 2012 EDT

Quantitative Assessment of the Effects of Strain on Future III-V Digital Applications

Umesh P. Gomes, Kumud Ranjan, Subhra Chowdhury, Palash Das, Servin Rathi, Dhrubes Biswas,
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Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.316
Journal of Microelectronics & Elect Pkg
Gomes, Umesh P., Kumud Ranjan, Subhra Chowdhury, Palash Das, Servin Rathi, and Dhrubes Biswas. 2012. “Quantitative Assessment of the Effects of Strain on Future III-V Digital Applications.” Journal of Microelectronics and Electronic Packaging 9 (1): 37–42. https:/​/​doi.org/​10.4071/​imaps.316.
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