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Vol. 7, Issue 2, 2010April 01, 2010 EDT

Qualification of Bonding Process of Temperature Sensors to Extreme Temperature Deep Space Missions

Rajeshuni Ramesham, Amarit Kitiyakara, Richard Redick, Eric T. Sunada,
Extreme temperaturesbonding process qualificationPRT reliabilitybonding materialsstakingPRT failuresinstallation failures
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-7.2.67
Journal of Microelectronics & Elect Pkg
Ramesham, Rajeshuni, Amarit Kitiyakara, Richard Redick, and Eric T. Sunada. 2010. “Qualification of Bonding Process of Temperature Sensors to Extreme Temperature Deep Space Missions.” Journal of Microelectronics and Electronic Packaging 7 (2): 67–72. https:/​/​doi.org/​10.4071/​1551-4897-7.2.67.
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