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Vol. 7, Issue 2, 2010April 01, 2010 EDT

Accelerated Tests for the Effects of Power Cycling on Tantalum Capacitors in a Humid Environment

J. Virkki, P. Raumonen,
Humiditypower cyclingreliability testingtantalum capacitors
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-7.2.111
Journal of Microelectronics & Elect Pkg
Virkki, J., and P. Raumonen. 2010. “Accelerated Tests for the Effects of Power Cycling on Tantalum Capacitors in a Humid Environment.” Journal of Microelectronics and Electronic Packaging 7 (2): 111–16. https:/​/​doi.org/​10.4071/​1551-4897-7.2.111.
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