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Journal of Microelectronics & Elect Pkg
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ISSN 1551-4897
General
Vol. 7, Issue 1, 2010January 01, 2010 EDT

Interfacial Reactions Between Electrodeposited Sn-Cu, Sn-Ag-Cu Solders and Cu, Ni Substrates

Chunfen Han, Qi Liu, Douglas G. Ivey,
Lead-free solderSn-CuSn-Ag-Cuinterfacial reactionsdiffusionmicrostructural characterization
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-7.1.48
Journal of Microelectronics & Elect Pkg
Han, Chunfen, Qi Liu, and Douglas G. Ivey. 2010. “Interfacial Reactions Between Electrodeposited Sn-Cu, Sn-Ag-Cu Solders and Cu, Ni Substrates.” Journal of Microelectronics and Electronic Packaging 7 (1): 48–57. https:/​/​doi.org/​10.4071/​1551-4897-7.1.48.

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