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Vol. 7, Issue 1, 2010January 01, 2010 EDT

Reliability of Ceramic Column Grid Array (CCGA717) Interconnect Packages Under Extreme Temperatures for Space Applications

Rajeshuni Ramesham,
Extreme temperaturesCCGA qualificationCCGA reliabilityWeibull analysisshape parameterssolder joint failures
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-7.1.16
Journal of Microelectronics & Elect Pkg
Ramesham, Rajeshuni. 2010. “Reliability of Ceramic Column Grid Array (CCGA717) Interconnect Packages Under Extreme Temperatures for Space Applications.” Journal of Microelectronics and Electronic Packaging 7 (1): 16–24. https:/​/​doi.org/​10.4071/​1551-4897-7.1.16.
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