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Vol. 6, Issue 2, 2009April 01, 2009 EDT

IMC Growth Mechanisms of SAC305 Lead-Free Solder on Different Surface Finishes and Their Effects on Solder Joint Reliability of FCBGA Packages

Sang Ha Kim, Hiroshi Tabuchi, Chika Kakegawa, Han Park,
Intermetallic compoundSAC305FCBGAsolder joint fatigueCu6Sn5Cu3Sn(CuNi)6Sn5
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-6.2.119
Journal of Microelectronics & Elect Pkg
Kim, Sang Ha, Hiroshi Tabuchi, Chika Kakegawa, and Han Park. 2009. “IMC Growth Mechanisms of SAC305 Lead-Free Solder on Different Surface Finishes and Their Effects on Solder Joint Reliability of FCBGA Packages.” Journal of Microelectronics and Electronic Packaging 6 (2): 119–24. https:/​/​doi.org/​10.4071/​1551-4897-6.2.119.
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