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Vol. 6, Issue 2, 2009April 01, 2009 EDT

Qualification Testing of Engineering Camera and Platinum Resistance Thermometer (PRT) Sensors for MSL Project Under Extreme Temperatures to Assess Reliability and to Enhance Mission Assurance

Rajeshuni Ramesham, Justin N. Maki, Gordon C. Cucullu,
Engineering cameraplatinum resistance thermometer (PRT)hardware qualificationextreme temperaturespackage qualificationpackage reliabilitythermal cyclingleadless chip carrier (LCC)
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-6.2.125
Journal of Microelectronics & Elect Pkg
Ramesham, Rajeshuni, Justin N. Maki, and Gordon C. Cucullu. 2009. “Qualification Testing of Engineering Camera and Platinum Resistance Thermometer (PRT) Sensors for MSL Project Under Extreme Temperatures to Assess Reliability and to Enhance Mission Assurance.” Journal of Microelectronics and Electronic Packaging 6 (2): 125–34. https:/​/​doi.org/​10.4071/​1551-4897-6.2.125.
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