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Vol. 6, Issue 1, 2009January 01, 2009 EDT

The Effect of Ultrasonic Frequency on Gold Wire Bondability and Reliability

Jianbiao Pan, Minh-Nhat Le, Cuong Van Pham,
Bondabilityorganic substratereliabilityultrasonic frequencywire bonding
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-6.1.89
Journal of Microelectronics & Elect Pkg
Pan, Jianbiao, Minh-Nhat Le, and Cuong Van Pham. 2009. “The Effect of Ultrasonic Frequency on Gold Wire Bondability and Reliability.” Journal of Microelectronics and Electronic Packaging 6 (1): 89–95. https:/​/​doi.org/​10.4071/​1551-4897-6.1.89.
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