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Vol. 5, Issue 3, 2008July 01, 2008 EDT

Application of Experimental and Finite Element Modal Analysis in Development of a Novel Solder Joint Inspection Systems

Lizheng Zhang, I. Charles Ume,
Flip chipinspectionsolder joint reliabilitymodal analysisfinite element modelinglaser ultrasound
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-5.3.97
Journal of Microelectronics & Elect Pkg
Zhang, Lizheng, and I. Charles Ume. 2008. “Application of Experimental and Finite Element Modal Analysis in Development of a Novel Solder Joint Inspection Systems.” Journal of Microelectronics and Electronic Packaging 5 (3): 97–103. https:/​/​doi.org/​10.4071/​1551-4897-5.3.97.
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