Broadband Dielectric Characterization of Aluminum Oxide (Al2O3)

Khalid Z. Rajab; Mira Naftaly; Edmund H. Linfield; Juan C. Nino; Daniel Arenas; David Tanner; Raj Mittra; Michael Lanagan

doi:10.4071/1551-4897-5.1.1

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Rajab, Khalid Z., Mira Naftaly, Edmund H. Linfield, Juan C. Nino, Daniel Arenas, David Tanner, Raj Mittra, and Michael Lanagan. 2008. “Broadband Dielectric Characterization of Aluminum Oxide (Al2O3).” Journal of Microelectronics and Electronic Packaging 5 (1): 2–7. https://doi.org/10.4071/1551-4897-5.1.1.

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