Vol. 5, Issue 1, 2008January 01, 2008 EDT
Development of Reliability Allocation and Assessment Algorithms for Designing Multilevel Microelectronic Systems
Development of Reliability Allocation and Assessment Algorithms for Designing Multilevel Microelectronic Systems
Kim, Injoong, Raghuram V. Pucha, Russell S. Peak, and Suresh K. Sitaraman. 2008. “Development of Reliability Allocation and Assessment Algorithms for Designing Multilevel Microelectronic Systems.” Journal of Microelectronics and Electronic Packaging 5 (1): 12–25. https://doi.org/10.4071/1551-4897-5.1.12.