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Vol. 4, Issue 1, 2007January 01, 2007 EDT

Fatigue Assessment of Solder Bumps on Board Assemblies Affected by PWB Warpage

Wei Tan, I. Charles Ume,
FatigueWarpageSolder Bump
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-4.1.37
Journal of Microelectronics & Elect Pkg
Tan, Wei, and I. Charles Ume. 2007. “Fatigue Assessment of Solder Bumps on Board Assemblies Affected by PWB Warpage.” Journal of Microelectronics and Electronic Packaging 4 (1): 37–44. https:/​/​doi.org/​10.4071/​1551-4897-4.1.37.
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