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ISSN 1551-4897
General
Vol. 3, Issue 4, 2006October 01, 2006 EDT

Electrical Characterization of FCBGA Package Based on Measurement Approach for High-speed SOC Applications

Ming-Kun Chen, Cheng-Chi Tai, Yu-Jung Huang,
Flip-chip Ball grid array (FCBGA)Electrical characterizationTime Domain Reflectometry (TDR)Vector Network Analyzer (VNA)System-on-chip (SOC)
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-3.4.216
Journal of Microelectronics & Elect Pkg
Chen, Ming-Kun, Cheng-Chi Tai, and Yu-Jung Huang. 2006. “Electrical Characterization of FCBGA Package Based on Measurement Approach for High-Speed SOC Applications.” Journal of Microelectronics and Electronic Packaging 3 (4): 216–25. https:/​/​doi.org/​10.4071/​1551-4897-3.4.216.

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