Properties and Stability of Thick-Film Resistors with Low Processing Temperatures - Effect of Composition and Processing Parameters

Sonia Menot-Vionnet; Thomas Maeder; Claudio Grimaldi; Caroline Jacq; Peter Ryser

doi:10.4071/1551-4897-3.1.37

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Menot-Vionnet, Sonia, Thomas Maeder, Claudio Grimaldi, Caroline Jacq, and Peter Ryser. 2006. “Properties and Stability of Thick-Film Resistors with Low Processing Temperatures - Effect of Composition and Processing Parameters.” Journal of Microelectronics and Electronic Packaging 3 (1): 37–43. https://doi.org/10.4071/1551-4897-3.1.37.

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