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Vol. 18, Issue 4, 2021October 01, 2021 EDT

Measurement Capability of Laser Ultrasonic Inspection System for Evaluation of Ball-Grid Array Package Solder Balls

Vishnu V. B. Reddy, Jaimal Williamson, Suresh K. Sitaraman,
Measurement capabilitygage repeatability and reproducibilityLaser ultrasonic inspectionMicroelectronic packages
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1501802
Journal of Microelectronics & Elect Pkg
Reddy, Vishnu V. B., Jaimal Williamson, and Suresh K. Sitaraman. 2021. “Measurement Capability of Laser Ultrasonic Inspection System for Evaluation of Ball-Grid Array Package Solder Balls.” Journal of Microelectronics and Electronic Packaging 18 (4): 183–89. https:/​/​doi.org/​10.4071/​imaps.1501802.
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