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Vol. 18, Issue 3, 2021July 01, 2021 EDT

Shear Strength Degradation Modeling of Lead-Free Solder Joints at Different Isothermal Aging Conditions

Dania Bani Hani, Raed Al Athamneh, Mohammed Aljarrah, Sa’d Hamasha,
SAC305shear strengthaginglead-free
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1423793
Journal of Microelectronics & Elect Pkg
Hani, Dania Bani, Raed Al Athamneh, Mohammed Aljarrah, and Sa’d Hamasha. 2021. “Shear Strength Degradation Modeling of Lead-Free Solder Joints at Different Isothermal Aging Conditions.” Journal of Microelectronics and Electronic Packaging 18 (3): 137–44. https:/​/​doi.org/​10.4071/​imaps.1423793.
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