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Vol. 2, Issue 3, 2005July 01, 2005 EDT

Interfacial Stresses in a Tri-Material Assembly Subjected to Differential Temperatures in the Layers in Electronic Packaging

D. Sujan, M. V. V. Murthy, K. N. Seetharamu, A. Y. Hassan,
Trimaterial AssemblyShearing StressPeeling StressTemperature RatioCoefficient of Thermal Expansion Ratio
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-2.3.162
Journal of Microelectronics & Elect Pkg
Sujan, D., M. V. V. Murthy, K. N. Seetharamu, and A. Y. Hassan. 2005. “Interfacial Stresses in a Tri-Material Assembly Subjected to Differential Temperatures in the Layers in Electronic Packaging.” Journal of Microelectronics and Electronic Packaging 2 (3): 162–70. https:/​/​doi.org/​10.4071/​1551-4897-2.3.162.
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