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Vol. 16, Issue 4, 2019October 01, 2019 EDT

Fabrication of Highly Reliable Joint Based on Cu/Ni/Sn Double-Layer Powder for High Temperature Application

Hongyan Xu, Yaochun Shen, Yihua Hu, Jianqiang Li, Ju Xu,
Three-dimensional networkhigh reliabilityinterfacial structure designtransient liquid phase bondingshear strength
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.960671
Journal of Microelectronics & Elect Pkg
Xu, Hongyan, Yaochun Shen, Yihua Hu, Jianqiang Li, and Ju Xu. 2019. “Fabrication of Highly Reliable Joint Based on Cu/Ni/Sn Double-Layer Powder for High Temperature Application.” Journal of Microelectronics and Electronic Packaging 16 (4): 188–95. https:/​/​doi.org/​10.4071/​imaps.960671.

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