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Vol. 17, Issue 1, 2020January 01, 2020 EDT

High Temperature and High Reliability Performance of Electrically Conductive Film Adhesives for RF Grounding Applications

Yuan Zhao, Doug Katze, John Wood, Bruno Tolla, Howard Yun,
RF power devicesthermal managementchip-scale coolingadhesivesRF grounding
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.967309
Journal of Microelectronics & Elect Pkg
Zhao, Yuan, Doug Katze, John Wood, Bruno Tolla, and Howard Yun. 2020. “High Temperature and High Reliability Performance of Electrically Conductive Film Adhesives for RF Grounding Applications.” Journal of Microelectronics and Electronic Packaging 17 (1): 9–12. https:/​/​doi.org/​10.4071/​imaps.967309.
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