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ISSN 1551-4897
General
Vol. 18, Issue 4, 2021October 01, 2021 EDT

Gallium-Nitride Field Effect Transistors in Extreme Temperature Conditions

Martijn S. Duraij, Yudi Xiao, Gabriel Zsurzsan, Zhe Zhang,
Device characterizationGaN-FEThigh temperatureparasitic componentsswitching lossesconduction losses
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1545724
Journal of Microelectronics & Elect Pkg
Duraij, Martijn S., Yudi Xiao, Gabriel Zsurzsan, and Zhe Zhang. 2021. “Gallium-Nitride Field Effect Transistors in Extreme Temperature Conditions.” Journal of Microelectronics and Electronic Packaging 18 (4): 168–76. https:/​/​doi.org/​10.4071/​imaps.1545724.

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