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Vol. 2, Issue 3, 2005July 01, 2005 EDT

Pretreatment of Blind Via Holes before Ni/Au and Cu Plating Applied with Atmospheric Pressure Plasma Jet

Yasushi Sawada, Keiichi Yamazaki, Noriyuki Taguchi, Tetsuji Shibata,
atmospheric pressure plasmadesmearsurface modificationblind via holephotolithographylaser-drillingwetting property
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/1551-4897-2.3.189
Journal of Microelectronics & Elect Pkg
Sawada, Yasushi, Keiichi Yamazaki, Noriyuki Taguchi, and Tetsuji Shibata. 2005. “Pretreatment of Blind Via Holes before Ni/Au and Cu Plating Applied with Atmospheric Pressure Plasma Jet.” Journal of Microelectronics and Electronic Packaging 2 (3): 189–96. https:/​/​doi.org/​10.4071/​1551-4897-2.3.189.
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