New Trim Configurations for Laser Trimmed Thick-Film Resistors – Experimental Verification

Slawomir Kaminski; Edward Mis; Maciej Szymendera; Andrzej Dziedzic

doi:10.4071/1551-4897-2.1.19

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Kaminski, Slawomir, Edward Mis, Maciej Szymendera, and Andrzej Dziedzic. 2005. “New Trim Configurations for Laser Trimmed Thick-Film Resistors – Experimental Verification.” Journal of Microelectronics and Electronic Packaging 2 (1): 19–24. https://doi.org/10.4071/1551-4897-2.1.19.

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