Vol. 2, Issue 1, 2005January 01, 2005 EDT
New Trim Configurations for Laser Trimmed Thick-Film Resistors – Experimental Verification
New Trim Configurations for Laser Trimmed Thick-Film Resistors – Experimental Verification
Kaminski, Slawomir, Edward Mis, Maciej Szymendera, and Andrzej Dziedzic. 2005. “New Trim Configurations for Laser Trimmed Thick-Film Resistors – Experimental Verification.” Journal of Microelectronics and Electronic Packaging 2 (1): 19–24. https://doi.org/10.4071/1551-4897-2.1.19.