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Vol. 19, Issue 4, 2022October 01, 2022 EDT

Sensor Systems for Extremely Harsh Environments

Holger Kappert, Sebastian Schopferer, Nooshin Saeidi, Ralf Döring, Steffen Ziesche, Alexander Olowinsky, Falk Naumann, Martin Jägle, Malte Spanier, Anton Grabmaier,
Harsh environmentshigh temperaturesensor systemsintegrated circuitssystem assembly
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1823777
Journal of Microelectronics & Elect Pkg
Kappert, Holger, Sebastian Schopferer, Nooshin Saeidi, Ralf Döring, Steffen Ziesche, Alexander Olowinsky, Falk Naumann, Martin Jägle, Malte Spanier, and Anton Grabmaier. 2022. “Sensor Systems for Extremely Harsh Environments.” Journal of Microelectronics and Electronic Packaging 19 (4): 101–14. https:/​/​doi.org/​10.4071/​imaps.1823777.
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