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ISSN 1551-4897
General
Vol. 19, Issue 4, 2022October 01, 2022 EDT

Sensor Systems for Extremely Harsh Environments

Holger Kappert, Sebastian Schopferer, Nooshin Saeidi, Ralf Döring, Steffen Ziesche, Alexander Olowinsky, Falk Naumann, Martin Jägle, Malte Spanier, Anton Grabmaier,
Harsh environmentshigh temperaturesensor systemsintegrated circuitssystem assembly
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1823777

Articles in Vol. 19, Issue 4, 2022

Vol. 19, Issue 4, 2022
  • Sensor Systems for Extremely Harsh Environments
    Holger KappertSebastian SchopfererNooshin SaeidiRalf DöringSteffen ZiescheAlexander OlowinskyFalk NaumannMartin JägleMalte SpanierAnton Grabmaier
  • Composite Soldering Materials Based on BiSnAg for High-Temperature Stable Solder Joints
    Andrej NovikovMathias Nowottnick
  • Detection of Printed Circuit Board Defects on ENIG and ENIPIG Surface Finishes with Convolutional Neural Networks and Evaluation of Training Parameters
    Angelika HablePaul TabatabaiHannah L. LichteneggerAnton ScherrThomas KrivecDieter P. Gruber
Journal of Microelectronics & Elect Pkg
Kappert, Holger, Sebastian Schopferer, Nooshin Saeidi, Ralf Döring, Steffen Ziesche, Alexander Olowinsky, Falk Naumann, Martin Jägle, Malte Spanier, and Anton Grabmaier. 2022. “Sensor Systems for Extremely Harsh Environments.” Journal of Microelectronics and Electronic Packaging 19 (4): 101–14. https://doi.org/10.4071/imaps.1823777.
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