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Vol. 20, Issue 1, 2023January 01, 2023 EDT

Study on CPI Behaviors of X Dimension Fan-Out Integration (XDFOI) Packages

Haijie Chen, Zhen Hu, Ming He, Jielei Xie, Yaojian Lin, Choon Heung Lee,
Chip packaging interaction (CPI)XDFOIFOWLPdielectric material stress
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/imaps.1926257
Journal of Microelectronics & Elect Pkg
Chen, Haijie, Zhen Hu, Ming He, Jielei Xie, Yaojian Lin, and Choon Heung Lee. 2023. “Study on CPI Behaviors of X Dimension Fan-Out Integration (XDFOI) Packages.” Journal of Microelectronics and Electronic Packaging 20 (1): 36–42. https:/​/​doi.org/​10.4071/​imaps.1926257.

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