Vol. 20, Issue 2, 2023April 01, 2023 EDT
Double-Sided Integrated GaN Power Module with Double Pulse Test (DPT) Verification
Double-Sided Integrated GaN Power Module with Double Pulse Test (DPT) Verification
Sinha, Sourish S., Tzu-Hsuan Cheng, and Douglas C. Hopkins. 2023. “Double-Sided Integrated GaN Power Module with Double Pulse Test (DPT) Verification.” Journal of Microelectronics and Electronic Packaging 20 (2): 71–81. https://doi.org/10.4071/001c.81980.