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ISSN 1551-4897
General
Vol. 20, Issue 3, 2023July 01, 2023 EDT

Investigation and Evaluation of High-Temperature Encapsulation Materials for Power Module Applications

Benjamin Lyon, Christina DiMarino,
packaginghigh-temperatureultra-wide bandgap semiconductorpower moduleencapsulation
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/001c.88421
Journal of Microelectronics & Elect Pkg
Lyon, Benjamin, and Christina DiMarino. 2023. “Investigation and Evaluation of High-Temperature Encapsulation Materials for Power Module Applications.” Journal of Microelectronics and Electronic Packaging 20 (3): 89–94. https:/​/​doi.org/​10.4071/​001c.88421.

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