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Vol. 20, Issue 4, 2023October 01, 2023 EDT

Factoring Interacting Stress Mechanisms in Design for Reliability of Extreme Environment Power Modules

David Huitink, Whit Vinson, Collin Ruby, Imam Al Razi, David Agogo-Mawuli, Alan Mantooth, Yarui Peng,
Accelerated testingdesign automationdesign for reliabilityinteracting failure mechanismslayout optimizationpower electronics
Copyright Logoccby-nc-nd-4.0 • https://doi.org/10.4071/001c.91213
Journal of Microelectronics & Elect Pkg
Huitink, David, Whit Vinson, Collin Ruby, Imam Al Razi, David Agogo-Mawuli, Alan Mantooth, and Yarui Peng. 2023. “Factoring Interacting Stress Mechanisms in Design for Reliability of Extreme Environment Power Modules.” Journal of Microelectronics and Electronic Packaging 20 (4): 107–11. https:/​/​doi.org/​10.4071/​001c.91213.
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